Ultra‐step‐up dc–dc converter with low‐voltage stress on devices

نویسندگان
چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Estimate the Performance of Catalytic Converter Using Turbulence Induce Devices

In this manuscript, the experimental setup was designed and fabricated for optimizing the parameters of a catalytic converter of INDICA V2 exhaust system. Three turbulence intensify devices, namely Swirl Venturi, Swirl Blades and Swirl Contour, were close-fitted before the catalytic converter. The heating element is embedded in its body and thermocouples are used for knowing the performance at ...

متن کامل

Based on a Modified SEPIC Converter with Low Voltage Stress

The boost topology is often the designer's first choice when dealing with PFC front-ends. This topology is well documented in the literature and has obvious advantages like continuous input current and low voltageand current-stress compared to other PFC topologies. The PFC SEPIC converter also has the advantage of the continuous input current but suffers from high voltageand current stress. In ...

متن کامل

Multi-level Converter with Optimal Number of Power Electronic Devices

In this paper, a new topology for cascaded multilevel converter based on sub multilevel converter units and full-bridge converters is proposed. The proposed topology significantly reduces the number of dc voltage sources, switches, IGBTs, and power diodes as the number of output voltage levels increases. Also, an algorithm to determine dc voltage sources magnitudes is proposed. To synthesize ma...

متن کامل

Crack opening profile in DCDC specimen

The opening profile of the cracks produced in the Double Cleavage Drilled Compression (DCDC) specimens for brittle materials is investigated. The study is achieved by combining Finite Element simulations of a DCDC linear elastic medium with experimental measurements by crack opening interferometry on pure silica glass samples. We show that the shape of the crack can be described by a simple exp...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: IET Power Electronics

سال: 2019

ISSN: 1755-4543,1755-4543

DOI: 10.1049/iet-pel.2018.5356